prof. RNDr. Ivan Ohlídal, DrSc.

2009

• Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films

  FRANTA Daniel NEČAS David OHLÍDAL Ivan HRDLIČKA Martin PAVLIŠTA Martin FRUMAR Miloslav OHLÍDAL Miloslav

  Article in Periodical

  Journal of Optoelectronics and Advanced Materials, year: 2009, volume: 11, edition: 12

• Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry

  OHLÍDAL Ivan NEČAS David FRANTA Daniel BURŠÍKOVÁ Vilma

  Article in Periodical

  Diamond and Related Materials, year: 2009, volume: 18, edition: 2-3, DOI

• Influence of Cross-Correlation of Rough Boundaries on Reflectance of Thin Films on GaAs and Si Substrates

  VIZDA Frantisek OHLÍDAL Ivan HRUBY Vojtech

  Article in Proceedings

  PHYSICS OF SEMICONDUCTORS, year: 2009

• Precise measurement of thickness distribution of non-uniform thin films by imaging spectroscopic reflectometry

  OHLÍDAL Miloslav OHLÍDAL Ivan KLAPETEK Petr NEČAS David

  Article in Proceedings

  Proceedings of IMEKO XIX World Congress, year: 2009

• Reflectance of non-uniform thin films

  NEČAS David OHLÍDAL Ivan FRANTA Daniel

  Article in Periodical

  Journal of Optics A: Pure and Applied Optics, year: 2009, volume: 11, edition: 4

2008

• Characterization of nanostructured diamond-like carbon coatings deposited in single and dual frequency capacitive discharges

  BURSIKOVA Vilma PERINA Vratislav SOBOTA Jaroslav GROSSMAN Jan KLAPETEK Petr BURSIK Jiri FRANTA Daniel OHLIDAL Ivan ZAJICKOVA Lenka HAVEL Josef JANCA Jan

  Conference abstract

  Year: 2008, type: Conference abstract

• Influence of cross-correlation effects on the optical quantities of rough films

  FRANTA Daniel OHLÍDAL Ivan NEČAS David

  Article in Periodical

  Optics Express, year: 2008, volume: 16, edition: 11

• Influence of shadowing on ellipsometric quantities of randomly rough surfaces and thin films

  OHLÍDAL Ivan NEČAS David

  Article in Periodical

  Journal of modern optics, year: 2008, volume: 55, edition: 7

• Nanoindentation studies on amorphous carbon films prepared using plasma enchanced chemical vapor deposition

  BURSIKOVA Vilma VALTR Miroslav KLAPETEL Petr BURSIK Jiri BLAHOVA Olga OHLIDAL Ivan

  Conference abstract

  Year: 2008, type: Conference abstract

• Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry

  OHLÍDAL Ivan NEČAS David BURŠÍKOVÁ Vilma FRANTA Daniel OHLÍDAL Miloslav

  Article in Periodical

  Diamond and Related Materials, year: 2008, volume: 17, edition: 1