prof. RNDr. Ivan Ohlídal, DrSc.

2006

• Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films

  OHLÍDAL Ivan FRANTA Daniel ŠILER Martin VIŽĎA František FRUMAR Miloslav JEDELSKÝ Jaroslav OMASTA Jaroslav

  Article in Periodical

  Journal of Non-Crystalline Solids, year: 2006, volume: 352, edition: 52-54

• Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy

  FRANTA Daniel OHLÍDAL Ivan KLAPETEK Petr NEPUSTILOVÁ Růžena BAJER Svatopluk

  Article in Periodical

  Surface and Interface Analysis, year: 2006, volume: 38, edition: 4

• Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces

  FRANTA Daniel OHLÍDAL Ivan

  Article in Periodical

  Journal of Optics A: Pure and Applied Optics, year: 2006, volume: 8, edition: 9

• Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry

  VALTR Miroslav OHLÍDAL Ivan FRANTA Daniel

  Article in Periodical

  Czech. J. Phys., year: 2006, volume: 56/2006, edition: Suppl. B

2005

• AFM Study of Hydrocarbon Thin Films

  VALTR Miroslav OHLÍDAL Ivan KLAPETEK Petr

  Article in Proceedings

  WDS'05 Proceedings of Contributed Papers: Part II - Physics of Plasmas and Ionized Media (ed. J. Safrankova), year: 2005

• Application of the wavelet transformation in AFM data analysis

  KLAPETEK Petr OHLÍDAL Ivan

  Article in Periodical

  Acta Physica Slovaca, year: 2005, volume: 55, edition: 3

• Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD

  KLAPETEK Petr OHLÍDAL Ivan MONTAIGNE RAMIL Alberto BONNANNI Alberta SITTER Helmut

  Article in Periodical

  Vacuum, year: 2005, volume: 80, edition: 1-3

• Atomic Force Microscope Tip Influence on the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough Surafaces

  KLAPETEK Petr OHLÍDAL Ivan BÍLEK Jindřich

  Article in Proceedings

  Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro-and Nanometer Range, year: 2005

• Combination of optical methods and atomic force microscopy at characterization of thin film systems

  OHLÍDAL Ivan FRANTA Daniel KLAPETEK Petr

  Article in Periodical

  Acta physica slovaca, year: 2005, volume: 55, edition: 3

• Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces

  FRANTA Daniel OHLÍDAL Ivan

  Article in Periodical

  Optics Communications, year: 2005, volume: 248, edition: 1