Spectroscopic ellipsometry of few-layer graphene

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Authors

ISIC Goran JAKOVLJEVIC Milka FILIPOVIC Marko JOVANOVIC Djordje VASIC Borislav LAZOVIC Sasa PUAC Nevena PETROVIC Zoran KOSTIC Radmila GAJIC Rados HUMLÍČEK Josef LOSURDO Maria BRUNO Giovanni BERGMAIR Iris HINGERLT Kurt

Year of publication 2011
Type Article in Periodical
Magazine / Source Journal of Nanophotonics
MU Faculty or unit

Faculty of Science

Citation
Doi http://dx.doi.org/10.1117/1.3598162
Field Solid matter physics and magnetism
Keywords graphene; ellipsometry; island film model
Description The optical properties of few-layer graphene (FLG) films were measured in the ultraviolet and visible spectrum using a spectroscopic ellipsometer equipped with a 50-mu m nominal microspot size. The FLG thickness was found by atomic force microscopy. Measurements revealed that the microspot is larger than the FLG flake. The ellipsometric data was interpreted using the island-film model. Comparison with graphite and recently published graphene data showed reasonable agreement, but with some features that could not be explained. The error margin for the optical constants was estimated to be +/- 10%.
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