Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment

Authors

NEUSCHITZER Markus MOSER Armin NEUHOLD Alfred KRAXNER Johanna STADLOBER Barbara OEHZELT Martin SALZMANN Ingo RESEL Roland NOVÁK Jiří

Year of publication 2012
Type Article in Periodical
Magazine / Source Journal of Applied Crystallography
Citation
Doi http://dx.doi.org/10.1107/S0021889812000908

You are running an old browser version. We recommend updating your browser to its latest version.

More info